HTTR shielding evaluations attribute the major part of the deposited radioactivity in the primary circuit to caesium. The same evaluation base gives two different assumed through-coating failure fractions — 1×10−2 for shielding design and 4×10−4 for maintenance dose — both carrying margin over the reported as-manufactured value.
Release from failed particles adds to the diffusive term. The getter addresses both, since it acts on Cs that has entered the matrix regardless of how it got there.